ELECTRON MICROSCOPICAL STUDY OF OXYGEN RELATED DEFECTS IN CZOCHRALSKI SILICON H. Bender, C. Claeys, J. Van Landuyt, G. Declerck, S. Amelinckx et R. Van OverstraetenJ. Phys. Colloques, 44 C4 (1983) C4-261-C4-265DOI: https://doi.org/10.1051/jphyscol:1983431
