TEM AND EBIC INVESTIGATIONS OF POLYCRYSTALLINE SILICON SHEETS GROWN BY THE RAD GROWTH PROCESS R. Sharko, A. Gervais et C. Texier-HervoJ. Phys. Colloques, 43 C1 (1982) C1-129-C1-133DOI: https://doi.org/10.1051/jphyscol:1982118
