COEXISTENCE OF INSULATING AND METALLIC ELECTRONIC PHASES IN DOPED SEMICONDUCTORS AT LOW TEMPERATURE : ELEMENTS OF A CONCENTRATION TEMPERATURE DIAGRAM P. Leroux Hugon et A. GhazaliJ. Phys. Colloques, 39 C6 (1978) C6-1074-C6-1076DOI: https://doi.org/10.1051/jphyscol:19786476
