La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program . Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).
Article cité :
J.A. LIDDLE , A. NORMAN , A. CEREZO , C.R.M. GROVENOR
J. Phys. Colloques, 49 C6 (1988) C6-509-C6-514
Citations de cet article :
20 articles
Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs
Ramya Cuduvally, Richard J.H. Morris, Piero Ferrari, et al. Ultramicroscopy 210 112918 (2020) https://doi.org/10.1016/j.ultramic.2019.112918
Springer Handbook of Microscopy
Thomas F. Kelly Springer Handbooks, Springer Handbook of Microscopy 715 (2019) https://doi.org/10.1007/978-3-030-00069-1_15
Field Emission Electronics
Nikolay Egorov and Evgeny Sheshin Springer Series in Advanced Microelectronics, Field Emission Electronics 60 43 (2017) https://doi.org/10.1007/978-3-319-56561-3_2
A simple approach to atom probe sample preparation by using shadow masks
Peter Felfer, Ingrid McCarroll, Chandra Macauley and Julie M. Cairney Ultramicroscopy 160 163 (2016) https://doi.org/10.1016/j.ultramic.2015.09.005
Behavior of molecules and molecular ions near a field emitter
Baptiste Gault, David W Saxey, Michael W Ashton, et al. New Journal of Physics 18 (3) 033031 (2016) https://doi.org/10.1088/1367-2630/18/3/033031
Atom Probe Tomography on Semiconductor Devices
Mansoor Ali Khan, Simon P. Ringer and Rongkun Zheng Advanced Materials Interfaces 3 (12) (2016) https://doi.org/10.1002/admi.201500713
Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN
David R. Diercks and Brian P. Gorman The Journal of Physical Chemistry C 119 (35) 20623 (2015) https://doi.org/10.1021/acs.jpcc.5b02126
Three-Dimensional Mapping of Quantum Wells in a GaN/InGaN Core–Shell Nanowire Light-Emitting Diode Array
James R. Riley, Sonal Padalkar, Qiming Li, et al. Nano Letters 13 (9) 4317 (2013) https://doi.org/10.1021/nl4021045
Atom Probe Tomography of a-Axis GaN Nanowires: Analysis of Nonstoichiometric Evaporation Behavior
James R. Riley, Rodrigo A. Bernal, Qiming Li, et al. ACS Nano 6 (5) 3898 (2012) https://doi.org/10.1021/nn2050517
Chemical mapping of mammalian cells by atom probe tomography
Kedar Narayan, Ty J. Prosa, Jing Fu, Thomas F. Kelly and Sriram Subramaniam Journal of Structural Biology 178 (2) 98 (2012) https://doi.org/10.1016/j.jsb.2011.12.016
Mass Spectrometry Handbook
Stefan Flege and Wolfgang Ensinger Mass Spectrometry Handbook 885 (2012) https://doi.org/10.1002/9781118180730.ch40
Atom probe tomography
Thomas F. Kelly and Michael K. Miller Review of Scientific Instruments 78 (3) 031101 (2007) https://doi.org/10.1063/1.2709758
Atom Probe Analysis of III–V and Si-Based Semiconductor Photovoltaic Structures
Brian P. Gorman, Andrew G. Norman and Yanfa Yan Microscopy and Microanalysis 13 (6) 493 (2007) https://doi.org/10.1017/S1431927607070894
Progress in the Atomic-Scale Analysis of Materials with the Three-Dimensional Atom Probe
A. Cerezo, D. J. Larson and G. D. W. Smith MRS Bulletin 26 (2) 102 (2001) https://doi.org/10.1557/mrs2001.296
Design of a scanning atom probe with improved mass resolution
A. Cerezo, T. J. Godfrey, M. Huang and G. D. W. Smith Review of Scientific Instruments 71 (8) 3016 (2000) https://doi.org/10.1063/1.1304877
H‐O. Andren 176 (1997) https://doi.org/10.1002/9783527612451.ch11
Composite thin-film characterization by atom probe field ion microscopy
A.J. Melmed and P.P. Camus Ultramicroscopy 35 (3-4) 277 (1991) https://doi.org/10.1016/0304-3991(91)90080-P
Preparation of (InGa)As/GaAs materials for TEM by one side non‐rotation ion beam thinning
J. Y. Yao and G. L. Dunlop Journal of Electron Microscopy Technique 19 (1) 90 (1991) https://doi.org/10.1002/jemt.1060190109
Application of position sensitive atom probe to the study of the microchemistry and morphology of quantum well interfaces
J. A. Liddle, A. G. Norman, A. Cerezo and C. R. M. Grovenor Applied Physics Letters 54 (16) 1555 (1989) https://doi.org/10.1063/1.101328
Surface analysis with a position-sensitive atom probe
A Cerezo, T J Godfrey, C R M Grovenor and G D W Smith Journal of Physics: Condensed Matter 1 (SB) SB99 (1989) https://doi.org/10.1088/0953-8984/1/SB/017