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Article cité :
R. Levi-Setti , Y.L. Wang , G. Crow
J. Phys. Colloques, 45 C9 (1984) C9-197-C9-205
Citations de cet article :
34 articles
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Bright focused ion beam sources based on laser-cooled atoms
J. J. McClelland, A. V. Steele, B. Knuffman, et al. Applied Physics Reviews 3 (1) 011302 (2016) https://doi.org/10.1063/1.4944491
Biological Low-Voltage Scanning Electron Microscopy
James B. Pawley Biological Low-Voltage Scanning Electron Microscopy 27 (2008) https://doi.org/10.1007/978-0-387-72972-5_2
Mass spectrometry on the nanoscale with ion sputtering based techniques: What is feasible
Igor V. Veryovkin, Wallis F. Calaway, C. Emil Tripa and Michael J. Pellin Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 261 (1-2) 508 (2007) https://doi.org/10.1016/j.nimb.2007.04.058
Improvements in SIMS continue
Nicholas Winograd, Zbigniew Postawa, Juan Cheng, et al. Applied Surface Science 252 (19) 6836 (2006) https://doi.org/10.1016/j.apsusc.2006.02.142
Ion beams and their applications in high-resolution probe formation
S.K. Guharay, J. Orloff and M. Wada IEEE Transactions on Plasma Science 33 (6) 1911 (2005) https://doi.org/10.1109/TPS.2005.860086
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Riccardo Levi‐Setti and Konstantin L. Gavrilov Encyclopedia of Imaging Science and Technology (2002) https://doi.org/10.1002/0471443395.img027
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F. A. Stevie, S. W. Downey, S. R. Brown, et al. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 17 (6) 2476 (1999) https://doi.org/10.1116/1.591115
Stable field-induced electron emission from a solidified liquid metal ion source
L. W. Chen and Y. L. Wang Applied Physics Letters 72 (3) 389 (1998) https://doi.org/10.1063/1.120745
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L. W. Chen and Y. L. Wang Applied Physics Letters 73 (15) 2212 (1998) https://doi.org/10.1063/1.122426
Morphological changes of Si(100) induced by focused ion beam irradiation
J.B. Wang, A. Datta and Y.L. Wang Applied Surface Science 135 (1-4) 129 (1998) https://doi.org/10.1016/S0169-4332(98)00285-2
Spatial and temporal scaling of oxide cluster aggregation on a liquid-gallium surface
Y. L. Wang and S. J. Lin Physical Review B 53 (10) 6152 (1996) https://doi.org/10.1103/PhysRevB.53.6152
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Direct measurements of room-temperature oxygen diffusion inYBa2Cu3Ox
R. Mogilevsky, R. Levi-Setti, B. Pashmakov, et al. Physical Review B 49 (9) 6420 (1994) https://doi.org/10.1103/PhysRevB.49.6420
Scanning ion microprobe analysis of composite materials
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James B. Pawley Advances in Electronics and Electron Physics, Microelectronics and Microscopy 83 203 (1992) https://doi.org/10.1016/S0065-2539(08)60008-6
Liquid metal ion sources and their applications
G.L.R. Mair International Journal of Mass Spectrometry and Ion Processes 114 (1-2) 1 (1992) https://doi.org/10.1016/0168-1176(92)85018-U
Oxide-growth kinetics and fractal-like patterning across liquid gallium surfaces
Jan M. Chabala Physical Review B 46 (18) 11346 (1992) https://doi.org/10.1103/PhysRevB.46.11346
Sputtering by Particle Bombardment III
Klaus Wittmaack Topics in Applied Physics, Sputtering by Particle Bombardment III 64 161 (1991) https://doi.org/10.1007/3540534288_18
Critical issues in the application of a gallium probe to high resolution secondary ion imaging
R. Levi-Setti, P. Hallégot, C. Girod, et al. Surface Science 246 (1-3) 94 (1991) https://doi.org/10.1016/0039-6028(91)90399-D
A design of large current ion gun employing liquid metal ion source
Yuzo Mori, Hui Wang, Katsuyoshi Endo, Kazuto Yamauchi and Takashi Ide Review of Scientific Instruments 61 (7) 1874 (1990) https://doi.org/10.1063/1.1141111
Graphite Intercalation Compounds I
Dah-Min David Hwang Springer Series in Materials Science, Graphite Intercalation Compounds I 14 247 (1990) https://doi.org/10.1007/978-3-642-75270-4_7
Microanalysis of precipitates in aluminum-lithium alloys with a scanning ion microprobe
D.B. Williams, R. Levi-Setti, J.M. Chabala, Y.L. Wang and D.E. Newbury Applied Surface Science 37 (1) 78 (1989) https://doi.org/10.1016/0169-4332(89)90975-6
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Focused ion‐beam milling of a submicrometer aperture for a hydrodynamic Josephson‐effect experiment
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R. E. Honig Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS V 44 2 (1986) https://doi.org/10.1007/978-3-642-82724-2_1
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R. Levi-Setti, G. Crow, Y. L. Wang, et al. Physical Review Letters 54 (24) 2615 (1985) https://doi.org/10.1103/PhysRevLett.54.2615