INFLUENCE OF THE SUPERFICIAL MASS MIGRATION PHENOMENON ON THE DETERMINATION OF THE METALLIC INTERFACIAL TENSIONS BY MULTI-PHASE EQUILIBRIUM METHOD

Abstract
The prominent superficial mass migration (abbr. SMM below) phenomenon of Pb or Bi radially along the solid surface of Cu from the liquid drop has been observed during the measurement of interfacial tensions in the binary systems of Cu-Pb, Cu-Bi with multi-phase equilibrium (abbr. MPE below) method. In order to reflect the influence of such SMM effect on the measurement of interfacial tensions with MPE method, the ω factor, which is called SMM factor and defined as ω=γ [MATH]V/γ SV (where γ [MATH]V represents the solid-vapor interfacial tension influenced by SMM effect), has been introduced. The initial analysis reveals that the ω factor is related with surface diffusion coefficient of liquid phase, temperature, configuration of solid surface and mutual solubility between liquid and solid phase.