| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
|
|
|---|---|---|
| Page(s) | C8-547 - C8-548 | |
| DOI | https://doi.org/10.1051/jphyscol:1989894 | |
36th International Field Emission Symposium
J. Phys. Colloques 50 (1989) C8-547-C8-548
DOI: 10.1051/jphyscol:1989894
Custom Probes Unlimited, Box 3938, Gaithersburg MD 20878, U.S.A.
J. Phys. Colloques 50 (1989) C8-547-C8-548
DOI: 10.1051/jphyscol:1989894
THE METHOD OF SHARP-POINTED SHARDS
A.J. MELMEDCustom Probes Unlimited, Box 3938, Gaithersburg MD 20878, U.S.A.
Abstract
A method of specimen preparation is presented which enables some important new classes of materials to be studied by field-ion microscopy, atom probe mass analysis, and field electron emission microscopy.