Numéro
J. Phys. Colloques
Volume 50, Numéro C1, Janvier 1989
International Conference on the Physics of Multiply Charged Ions and International Workshop on E.C.R. Ion Sources
Page(s) C1-7 - C1-17
DOI https://doi.org/10.1051/jphyscol:1989102
International Conference on the Physics of Multiply Charged Ions and International Workshop on E.C.R. Ion Sources

J. Phys. Colloques 50 (1989) C1-7-C1-17

DOI: 10.1051/jphyscol:1989102

ELECTRON CAPTURE BY MULTICHARGED IONS AT eV ENERGIES

C.C. HAVENER, M.S. HUQ, F.W. MEYER and R.A. PHANEUF

Oak Ridge National Laboratory, Oak Ridge, TN 37831-6372, U.S.A.


Abstract
A multicharged ion-atom merged-beams apparatus has been used in conjunction with the ORNL-ECR ion source to measure accurate absolute electron-capture cross sections in the energy range from below 1 eV/amu to 1500 eV/amu. Measurements for N3+,4+,5+ + H(D) collisions indicate good agreement with available theoretical calculations. However, measurements with O5+ + H(D) show an unexpected low-energy behavior which may be attributable to the ion-induced-dipole attraction between the reactants. Scaled Landau-Zener calculations presented here identify a transfer plus excitation channel which has the correct energy dependence at low energies. This finding suggests the need for a comprehensive coupled channel calculation which would include such product states.