| Numéro |
J. Phys. Colloques
Volume 49, Numéro C8, Décembre 1988
Proceedings of the International Conference on Magnetism
|
|
|---|---|---|
| Page(s) | C8-1999 - C8-2000 | |
| DOI | https://doi.org/10.1051/jphyscol:19888907 | |
Proceedings of the International Conference on Magnetism
J. Phys. Colloques 49 (1988) C8-1999-C8-2000
DOI: 10.1051/jphyscol:19888907
1 Control Data Corporation, Minneapolis, MN-55435, U.S.A.
2 University of Minnesota, Minneapolis, MN-55455, U.S.A.
J. Phys. Colloques 49 (1988) C8-1999-C8-2000
DOI: 10.1051/jphyscol:19888907
STRUCTURE-MAGNETIC PROPERTY CORRELATIONS OF CROSS SECTIONS OF DC MAGNETRON SPUTTERED CoCr THIN FILMS
D. P. Ravipati1, P. B. Narayan1, J. M. Sivertsen2 et J. H. Judy21 Control Data Corporation, Minneapolis, MN-55435, U.S.A.
2 University of Minnesota, Minneapolis, MN-55455, U.S.A.
Abstract
CoCr film structural features, on Al and NiP (on Al) substrates were established by control of process conditions to optimize structure sensitive properties like perpendicular coercivity. Hc(⊥) depends strongly on process conditions but relatively independent of substrate type. Rough substrates produced films exhibiting less uniformity in columnar grain diameters.