| Numéro |
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell ProcessesVol. 1 |
|
|---|---|---|
| Page(s) | C9-267 - C9-270 | |
| DOI | https://doi.org/10.1051/jphyscol:1987946 | |
X-Ray and Inner-Shell Processes
Vol. 1
J. Phys. Colloques 48 (1987) C9-267-C9-270
DOI: 10.1051/jphyscol:1987946
1 Institute of Physics, University of Aarhus, DK-8000 Aarhus, Denmark
2 Laboratoire de Spectroscopie Atomique, Université de Caen, Esplanade de la Paix, F-14032 Caen Cedex, France
Vol. 1
J. Phys. Colloques 48 (1987) C9-267-C9-270
DOI: 10.1051/jphyscol:1987946
SOFT X-RAY SPECTROSCOPY OF ARGON RECOIL IONS
F. FOLKMANN1, I. LESTEVEN-VAÏSSE2, A. BEN SITEL2, M. CHANTEPIE2 and D. LECLER21 Institute of Physics, University of Aarhus, DK-8000 Aarhus, Denmark
2 Laboratoire de Spectroscopie Atomique, Université de Caen, Esplanade de la Paix, F-14032 Caen Cedex, France
Abstract
Radiation from argon with wavelength 8-85 nm has been measured with a grazing incidence spectrometer after excitation by 0.7 MeV/amu Cl11+ and 0.35 Mev/amu Cl9+ and Br14+. 417 lines have been identified. With a pulsed beam the radiation has been sorted into prompt and delayed fractions. Decay time analysis for separate peaks is correlated to charge state of the recoil ion. This leads especially to good assignment of Ar VII and Ar VIII lines. Delayed spectra do not depend much on projectile charge and velocity.