Numéro
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell Processes
Vol. 1
Page(s) C9-247 - C9-250
DOI https://doi.org/10.1051/jphyscol:1987941
X-Ray and Inner-Shell Processes
Vol. 1

J. Phys. Colloques 48 (1987) C9-247-C9-250

DOI: 10.1051/jphyscol:1987941

RELAXATION EFFECTS IN FLUORINE K AUGER AND PHOTOELECTRON SPECTRA

O. BENKA1 and M. UDA2

1  Institut für Experimentalphysik, Universität Linz, A-4040 Linz-Auhof, Austria
2  The Institute of Physical and Chemical Research, Wako-Shi, Saitama 351, Japan


Abstract
Fluorine K Auger and photoelectron spectra excited by monochromatized Al Kα X-rays were measured for alkali metal and alkaline earth fluorides. An anomalous stucture of the main Auger line (KL23L23) was recently found and explained by a resonant electron transfer (RET) relaxation mechanism. From the energy difference of the Auger and photoelectron lines from the solids compared to free ions, relaxation and Madelung energies were evaluated. The results were in good agreement with theoretical ones used in the calculations of the RET energies confirming the RET relaxation mechanism.