Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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Page(s) | C6-287 - C6-292 | |
DOI | https://doi.org/10.1051/jphyscol:1987647 |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-287-C6-292
DOI: 10.1051/jphyscol:1987647
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OX1 3PH, U.K.
J. Phys. Colloques 48 (1987) C6-287-C6-292
DOI: 10.1051/jphyscol:1987647
A FIM/AP INVESTIGATION OF A RAPIDLY SOLIDIFIED ALUMINIUM-CHROMIUM ALLOY
A. Cerezo, B.A. Shollock et G.D.W. SmithDepartment of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OX1 3PH, U.K.
Abstract
A rapidly solidified Al - 6 to 9wt%Cr alloy formed by vapour deposition has been studied by field-ion microscopy and atom probe microanalysis (FIM/AP). The as-deposited material was found to contain brightly imaging Cr-rich particles, both spherical and rod-shaped, of about 0.5-1nm in diameter and up to 5nm long. Random area AP analysis showed the presence of Cr-enrichment on a very fine scale, with estimated particle compositions of 30-50at%Cr. No change in particle size or composition was observed for aging at 350°C for up to 20 hours. By comparison, an Al-4wt%Cr wire formed by in-rotating-water quenching showed no indication of precipitation in its as-received state by either FIM or AP.