Numéro
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
Page(s) C6-287 - C6-292
DOI https://doi.org/10.1051/jphyscol:1987647
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ

J. Phys. Colloques 48 (1987) C6-287-C6-292

DOI: 10.1051/jphyscol:1987647

A FIM/AP INVESTIGATION OF A RAPIDLY SOLIDIFIED ALUMINIUM-CHROMIUM ALLOY

A. Cerezo, B.A. Shollock et G.D.W. Smith

Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OX1 3PH, U.K.


Abstract
A rapidly solidified Al - 6 to 9wt%Cr alloy formed by vapour deposition has been studied by field-ion microscopy and atom probe microanalysis (FIM/AP). The as-deposited material was found to contain brightly imaging Cr-rich particles, both spherical and rod-shaped, of about 0.5-1nm in diameter and up to 5nm long. Random area AP analysis showed the presence of Cr-enrichment on a very fine scale, with estimated particle compositions of 30-50at%Cr. No change in particle size or composition was observed for aging at 350°C for up to 20 hours. By comparison, an Al-4wt%Cr wire formed by in-rotating-water quenching showed no indication of precipitation in its as-received state by either FIM or AP.