Numéro
J. Phys. Colloques
Volume 48, Numéro C5, Novembre 1987
3rd International Conference on Modulated Semiconductor Structures
Page(s) C5-199 - C5-202
DOI https://doi.org/10.1051/jphyscol:1987540
3rd International Conference on Modulated Semiconductor Structures

J. Phys. Colloques 48 (1987) C5-199-C5-202

DOI: 10.1051/jphyscol:1987540

MONTE CARLO STUDY OF EPITAXIAL OVERLAYER WITH SUBSTANTIAL LATTICE MISMATCH

T. MIYASAKI1, K. AIZAWA1, H. AOKI2, C. ITOH3 et M. OKAZAKI1

1  Institute of Materials Science, University of Tsukuba, Ibaraki 305, Japan
2  Department of Physics, University of Tokyo, Hongo, Tokyo 113, Japan
3  Seiko-Epson Co. Ltd, 3-3-5 Owa. Suwa, Nagano 392, Japan


Abstract
The atomic configuration of an epitaxial overlayer on a substrate with substantial lattice mismatch is studied by the Monte Carlo method. Covering a wide range of the ratio of intra- and inter-layer interactions, we have clarified a succession of several phases. Circular boundary conditions are also examined to elucidate island/domain structures.