| Numéro |
J. Phys. Colloques
Volume 48, Numéro C3, Septembre 1987
4th International Aluminium Lithium Conference
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|---|---|---|
| Page(s) | C3-521 - C3-526 | |
| DOI | https://doi.org/10.1051/jphyscol:1987360 | |
4th International Aluminium Lithium Conference
J. Phys. Colloques 48 (1987) C3-521-C3-526
DOI: 10.1051/jphyscol:1987360
Cégédur-Péchiney, Centre de Recherche et Développement, B.P. 27, F-38340 Voreppe, France
J. Phys. Colloques 48 (1987) C3-521-C3-526
DOI: 10.1051/jphyscol:1987360
SIMS DETERMINATION OF THE SURFACE LITHIUM DEPLETION ZONE IN Al-Li ALLOYS BY QUANTITATIVE IMAGE ANALYSIS
N. THORNE, A. DUBUS, J.M. LANG, F. DEGREVE et P. MEYERCégédur-Péchiney, Centre de Recherche et Développement, B.P. 27, F-38340 Voreppe, France
Abstract
The heat treatment of Al-Li alloys induces a Li depletion zone of up to 100µm beneath the metal surface. Characterisation of the Li concentration profile is not possible using conventional Energy Dispersive X-Ray (EDX) based techniques as they are limited to "heavy elements" (At. N° > 5). Secondary Ion Mass Spectrometry (SIMS) has no such limit and "long range" quantitative Li depth profiles may be obtained from polished cross-sections. The advent of direct ion imaging allied with quantitative image analysis provides two major improvements over traditional "line-scans" : optimised lateral (depth) resolution of 1µm and acquisition times reduced by a factor of about 100.