| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|
|---|---|---|
| Page(s) | C8-153 - C8-157 | |
| DOI | https://doi.org/10.1051/jphyscol:1986828 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-153-C8-157
DOI: 10.1051/jphyscol:1986828
1 and Chemistry Department, The Chinese University of Hong- Kong, Shatin , Hong- Kong
2 Chemistry Department, Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
J. Phys. Colloques 47 (1986) C8-153-C8-157
DOI: 10.1051/jphyscol:1986828
X-RAY ABSORPTION MEASUREMENTS OF ORGANIC SOLUTIONS OF ORGANOMETALLICS WITH SCINTILLATION COUNTING METHODS
T.K. SHAM1, R.A. HOLROYD2 et R.C. MUNOZ21 and Chemistry Department, The Chinese University of Hong- Kong, Shatin , Hong- Kong
2 Chemistry Department, Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
Abstract
We report a new technique with which X-ray absorption measurements of solutions can be made by counting the X-ray induced luminescence from the sample. This technique (scintillation yield) involves the addition of a small amount of scintillator to the sample solution. Simultaneous measurements of X-ray absorption spectra of (CH3)4 Sn in organic scintillator solutions using photoconductivity and scintillation yield are reported to illustrate the feasibility of this technique.