| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|---|---|---|
| Page(s) | C8-1061 - C8-1064 | |
| DOI | https://doi.org/10.1051/jphyscol:19868206 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-1061-C8-1064
DOI: 10.1051/jphyscol:19868206
1 Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
2 Physics Department, General Motors Research, Warren, MI 48090-9055, U.S.A.
J. Phys. Colloques 47 (1986) C8-1061-C8-1064
DOI: 10.1051/jphyscol:19868206
EXAFS STUDY OF COPPER-HAFNIUM MULTILAYERS
S.M. HEALD1, J.M. TRANQUADA1, B.M. CLEMENS2 et J.P. STEC21 Brookhaven National Laboratory, Upton, NY 11973, U.S.A.
2 Physics Department, General Motors Research, Warren, MI 48090-9055, U.S.A.
Abstract
EXAFS measurements have been made on a number of Cu-Hf multilayers with modulation wavelengths of 1/2 to 20 close-packed monolayers. Clear indications are found for an amorphous interfacial compound. Fitting of the EXAFS spectra indicate that the interfacial regions are about 8-10 layers thick, and contain nearly equal numbers of layers of Hf and Cu. The results are compared to x-ray diffraction studies of the same samples.