| Numéro |
J. Phys. Colloques
Volume 47, Numéro C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
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| Page(s) | C7-121 - C7-126 | |
| DOI | https://doi.org/10.1051/jphyscol:1986722 | |
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-121-C7-126
DOI: 10.1051/jphyscol:1986722
Department of Chemistry and Laboratory for Surface Studies, University of Wisconsin-Milwaukee, Milwaukee, WI 53201, U.S.A.
J. Phys. Colloques 47 (1986) C7-121-C7-126
DOI: 10.1051/jphyscol:1986722
ANALYSIS OF FIELD EMITTER SURFACES BY VERY HIGH RESOLUTION AUGER ELECTRON SPECTROSCOPY
M. MUNDSCHAU et R. VANSELOWDepartment of Chemistry and Laboratory for Surface Studies, University of Wisconsin-Milwaukee, Milwaukee, WI 53201, U.S.A.
Abstract
Impurity segregation on Pt was studied using very high resolution Auger electron spectroscopy analysis of annealed field emitter surfaces. Using elemental analysis obtained from the Auger studies to complement information obtained from field emission microscopy studies, the lateral distribution of segregated surface impurities was determined at the sub-micron level.