| Numéro |
J. Phys. Colloques
Volume 46, Numéro C4, Avril 1985
International Conference on the Structure and Properties of Internal Interfaces
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|---|---|---|
| Page(s) | C4-435 - C4-440 | |
| DOI | https://doi.org/10.1051/jphyscol:1985448 | |
International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 46 (1985) C4-435-C4-440
DOI: 10.1051/jphyscol:1985448
Laboratoire de Chimie Appliquée, Université Paris-Sud, 91405 Orsay Cedex, France
J. Phys. Colloques 46 (1985) C4-435-C4-440
DOI: 10.1051/jphyscol:1985448
T.E.M. STUDY OF THE TEXTURE AND PREFERENTIAL ORIENTATION OF GRAIN BOUNDARIES IN POLYCRYSTALLINE NiO PREPARED BY METAL OXIDATION
M. Dechamps, A. Marrouche, F. Barbier et A. RevcolevschiLaboratoire de Chimie Appliquée, Université Paris-Sud, 91405 Orsay Cedex, France
Résumé
On a déterminé par diffraction électronique les relations d'orientation, l'indice de coïncidence et le plan du joint de grains de 71 couples de cristaux adjacents dans de l'oxyde de nickel polycristallin.
Abstract
Orientation relations, coincidence index and Miller indices of grain boundary planes were determined by electron diffraction for 71 couples of adjacent crystals in polycrystalline NiO prepared by oxidation of Ni.