Numéro
J. Phys. Colloques
Volume 43, Numéro C4, Décembre 1982
ICOMAT-82
International Conference on Martensitic Transformations
Page(s) C4-185 - C4-190
DOI https://doi.org/10.1051/jphyscol:1982422
ICOMAT-82
International Conference on Martensitic Transformations

J. Phys. Colloques 43 (1982) C4-185-C4-190

DOI: 10.1051/jphyscol:1982422

TRANSMISSION ELECTRON MICROSCOPY OF MARTENSITIC INTERFACES

K.M. Knowles1, J.W. Christian2 et D.A. Smith3

1  Department of Metallurgy and Materials Technology, University of Surrey, Guildford GU2 5XH, England
2  University of Oxford, Department of Metallurgy and Science of Materials, Parks Road, Oxford, England
3  Thomas J. Watson Research Center, IBM Corporation, Yorktown Heights, N.Y. 10598, U.S.A.


Abstract
By observing suitable systems in the transmission electron microscope (t.e.m.), it is possible to obtain useful information on the structure of parent-martensite, transformation twin and intervariant interface. In this article, we review our recent work on Ni-Ti, Ti-Mn and Au-Cd alloys using both conventional and high resolution t.e.m., and we show how these techniques can be used to increase our understanding of martensitic interfaces.