Fast ion spectroscopy
International Conference on beam-foil spectroscopy, 5^th

J. Phys. Colloques 40 (1979) C1-211-C1-214
DOI: 10.1051/jphyscol:1979143

A MEASUREMENT OF THE 1s2p³P_lLIFETIME IN HELIUM LIKE SILICON

I.A. Armour^{1, 2}, S. Bashkin³, N.A. Jelley^{1, 2}, R. O'Brien⁴, J.D. Silver^{1, 2} et E. Trabert<sup>5

1</sup>  University of Oxford, Clarendon Laboratory, Parks Road, Oxford
²  Nuclear Physics Laboratory, Keble Road, Oxford, England
³  College of Liberal Arts, University of Arizona, Tucson, Arizona 85721, USA
⁴  Melbourne State College, 757 Swanston St., Carlton, Victoria 3053, Australia
⁵  Experimentalphysik III, Ruhr-Universitat, Postfach 102148, D-4630, Bochum 1, F.R. Germany

Abstract
We have observed the soft X-ray spectrum of highly ionised silicon and made measurements of the 1s2p³P₁ lifetime of the helium like system. Standard beam foil decay curve techniques were used and the ³P₁ decay to the ground state was observed with a curved crystal X-ray spectrometer. A preliminary result of 6.68 ± 0.40 ps was obtained which compares with theoretical estimates of 6.33 ps and 6.62 ps.

Résumé
Nous avons observé le spectre des ions de silicium multi ionisé, et nous avons mesuré la durée de vie du niveau 1s2p³P₁ de Si¹²⁺. On a utilisé les techniques de beam foil spectroscopie, et la decroissance du ³P₁ au niveau fondamental etait observé avec un spectrometre de Rayons X à cristal courbe. Notre resultat preliminaire est 6.68 ± 0.40 ps, qu'on peut comparer avec les valeurs theoriques de 6,33 et 6,62 ps.