Numéro
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell Processes
Vol. 1
Page(s) C9-863 - C9-866
DOI https://doi.org/10.1051/jphyscol:19879155
X-Ray and Inner-Shell Processes
Vol. 1

J. Phys. Colloques 48 (1987) C9-863-C9-866

DOI: 10.1051/jphyscol:19879155

NEAR EDGE FINE STRUCTURE OF Li, Be AND GRAPHITE BY X-RAY RAMAN SCATTERING

H. NAGASAWA

Hahn-Meitner-Institut, Glienicker Strasse 100, D-1000 Berlin 39, F.R.G.


Abstract
The near edge fine structure of the x-ray Raman spectra in Li, Be and graphite was measured in an x-ray inelastic scattering experiment with 0.8 eV resolution. The x-ray Raman spectrum, which is identical to the dynamical structure factor S([MATH], ω) of inner-shell electrons for qa < 1, where hq i s the momentum transfer and a is the orbital radius of the inner-shell electrons, has been confirmed experimentally to be equivalent to the corresponding soft x-ray absorption spectrum. It is concluded that x-ray Raman scattering has several experimental advantages over an absorption experiment for light elements.