Numéro
J. Phys. Colloques
Volume 48, Numéro C7, Décembre 1987
1st International Laser M2P Conference
Page(s) C7-687 - C7-687
DOI https://doi.org/10.1051/jphyscol:19877167
1st International Laser M2P Conference

J. Phys. Colloques 48 (1987) C7-687-C7-687

DOI: 10.1051/jphyscol:19877167

STUDIES OF SAPPHIRE PHOTOABLATION BY LASER-INDUCED FLUORESCENCE AND PHOTOTHERMAL DEFORMATION MEASUREMENTS

R.W. DREYFUS, R. KELLY, F.A. MC DONALD and R.J. von GUTFELD

IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598, U.S.A.


Abstract
Crystalline sapphire displays a low, 0.6 J/CM2, threshold for etching with 193 nm excimer pulses. Understanding this low-threshold etching involves knowledge of the pathways by which laser energy gives rise to material removal. An accurate knowledge of surface temperature during irradiation appears sufficient to differentiate between classical thermal vaporization and electronic, I.E. photochemical mechanisms for etching.