| Numéro |
J. Phys. Colloques
Volume 49, Numéro C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
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| Page(s) | C6-335 - C6-340 | |
| DOI | https://doi.org/10.1051/jphyscol:1988658 | |
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
J. Phys. Colloques 49 (1988) C6-335-C6-340
DOI: 10.1051/jphyscol:1988658
Institut für Metallphysik, Universität Göttingen, Hospitalstrasse 3-5, D-3400 Göttingen and Sonderforschungsbereich 126, Göttingen/Clausthal, F.R.G.
J. Phys. Colloques 49 (1988) C6-335-C6-340
DOI: 10.1051/jphyscol:1988658
GRAIN BOUNDARY ANALYSIS IN Ni-C BY MEANS OF ATOM-PROBE FIELD-ION MICROSCOPY
L.V. ALVENSLEBENInstitut für Metallphysik, Universität Göttingen, Hospitalstrasse 3-5, D-3400 Göttingen and Sonderforschungsbereich 126, Göttingen/Clausthal, F.R.G.
Abstract
Grain boundary analysis with the help of FIM/AP needs an aimed tip-preparation technique unless the grain size of the material is very small. Therefore a dedicated FIM-tip holder for the TEM (Philips EM 400) was designed to analyse and optimize the distance from grain boundary to tip apex and to determine the orientation of the grain boundary with the tip. In a Ni-1at% C alloy, the carbon atoms image "brighter" than the surrounding Ni-atoms, as shown by a drop of the detector current. A segregation of carbon at grain boundaries was recorded with the atomprobe.