Numéro
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell Processes
Vol. 1
Page(s) C9-427 - C9-438
DOI https://doi.org/10.1051/jphyscol:1987972
X-Ray and Inner-Shell Processes
Vol. 1

J. Phys. Colloques 48 (1987) C9-427-C9-438

DOI: 10.1051/jphyscol:1987972

NEAR THRESHOLD BEHAVIOR OF PHOTOELECTRON SATELLITE INTENSITIES

D.A. SHIRLEY1, U. BECKER2, P.A. HEIMANN3 and B. LANGER4

1  Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, U.S.A.
2  Physikalisches Institut, Universität Würzburg, Am Hubland, D-8700 Würzburg, F.R.G.
3  Physik-Department, Technische Universität München, D-8000 München, F.R.G.
4  Technische Universität Berlin, Institut für Strahlungs- und Kernphysik, Sekr, PN 3-2, Hardenbergstrasse 36, D-1000 Berlin 12, F.R.G.


Abstract
The historical background and understanding of photoelectron satellite peaks is reviewed, using He(n), Ne(ls), Ne(2p), Ar(ls), and Ar(3s) as case studies. Threshold studies are emphasized. The classification of electron correlation effects as either "intrinsic" or "dynamic" is recommended.