| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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| Page(s) | C6-305 - C6-310 | |
| DOI | https://doi.org/10.1051/jphyscol:1987650 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-305-C6-310
DOI: 10.1051/jphyscol:1987650
Department of Applied Physics, Materials Science Centre, University of Groningen, Nijenborgh 18, 9747 AG Groningen, The Netherlands
J. Phys. Colloques 48 (1987) C6-305-C6-310
DOI: 10.1051/jphyscol:1987650
FIELD ION MICROSCOPE, IMAGING ATOM PROBE STUDY OF METALLIC GLASSES
H.B. Elswijk, P.M. Bronsveld et J. Th. M. De HossonDepartment of Applied Physics, Materials Science Centre, University of Groningen, Nijenborgh 18, 9747 AG Groningen, The Netherlands
Abstract
The application of a field ion microscope and imaging atom probe to the problem of atomic structure of metallic glasses has been investigated in two systems, Ni40Pd40P20, an amorphous alloy of the type transition metal-metalloid, and FeZr, an alloy system of two transition metals, of which two compositions are studied. The spatial resolution of both techniques does not permit to probe local atomic configurations, but homogeneity on a nm scale and the presence of microcrystallites can be established.