| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|---|---|---|
| Page(s) | C8-391 - C8-394 | |
| DOI | https://doi.org/10.1051/jphyscol:1986877 | |
J. Phys. Colloques 47 (1986) C8-391-C8-394
DOI: 10.1051/jphyscol:1986877
ANALYSIS OF BOND STRENGTHS OF ARSENIC AND ARSENIC CHALCOGEN COMPOUNDS USING THE TEMPERATURE DEPENDENCE OF THE EXAFS
C.Y. YANG, M.A. PAESLER et D.E. SAYERSDepartment of Physics, North Carolina State University, Raleigh, NC 27695-8202, U.S.A.
Abstract
We present a study of the temperature dependence of the EXAFS of crystalline (c-) As. As2S3 and As4S4, amorphous (a-) As and glassy (g-) As2S3. Based on an Einstein mode, we find that for the first shell of these materials, the mean square relative displacement (MSRD) is related to the bond-stretching force constant. Our result indicates that As-As bonds in c- As are about 17% softer than those in a- As. The stretching forces of the As-S bonds in c- and g- As2S3 are quite similar. The calculation of bond strengths in c- As4S4 shows that As-S bonds are about 30% stronger than As-As bonds. This work underscores the fact that temperature dependent EXAFS data may be used to provide information about the nature and, in particular, the strength of local bonding.