INVESTIGATION OF BURRIED INTERFACE (Si3N4/Ga As) BY EXAFS IN TOTAL REFLECTION AND DISPERSIVE MODE E. DARTYGE, A. FONTAINE, A. JUCHA, G. TOURILLON, J.F. PERAY, R. JOUBARD et P. ALNOT J. Phys. Colloques, 47 C8 (1986) C8-415-C8-418 DOI: 10.1051/jphyscol:1986883