Supplément au Journal de Physique Colloques

Subscriber Authentication Point

EDPS Account

INTERNAL MEASUREMENTS FOR FAILURE ANALYSIS AND CHIP VERIFICATION OF VLSI CIRCUITS

J. KÖLZER and J. OTTO

J. Phys. Colloques, 50 C6 (1989) C6-173

DOI: 10.1051/jphyscol:1989627

This search tool will display articles in Pubmed database database by authors of the selected article:

Select your author(s):

J. KÖLZER

J. OTTO

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)