NUMERICAL SIMULATIONS TO IMPROVE THE ACCURACY OF ELECTRON-BEAM TESTING ON PASSIVATED INTEGRATED CIRCUITS H. FREMONT, A. TOUBOUL, D. GOBLED et Y. DANTO J. Phys. Colloques, 49 C4 (1988) C4-149-C4-152 DOI: 10.1051/jphyscol:1988429