Supplément au Journal de Physique Colloques

HOT ELECTRON RELIABILITY OF DEEP SUBMICRON MOS TRANSISTORS

G. REIMBOLD, F. PAVIET-SALOMON, H. HADDARA, G. GUEGAN and S. CRISTOLOVEANU

J. Phys. Colloques, 49 C4 (1988) C4-665-C4-668

DOI: 10.1051/jphyscol:19884139

G. REIMBOLD

F. PAVIET-SALOMON

H. HADDARA

G. GUEGAN

S. CRISTOLOVEANU

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