DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE F.R. THORNLEY, G.M. ANTONINI, G.N. GREAVES et N.T. BARRETT J. Phys. Colloques, 47 C8 (1986) C8-883-C8-886 DOI: 10.1051/jphyscol:19868171