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A MEASUREMENT OF A SURFACE SELF-DIFFUSION COEFFICIENT BY SCANNING TUNNELING MICROSCOPY

M. DRECHSLER, B.L. BLACKFORD, A.M. PUTNAM, M.H. JERICHO

J. Phys. Colloques, 50 C8 (1989) C8-223-C8-228

DOI: https://doi.org/10.1051/jphyscol:1989838

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