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Cited article:

SEM MICROCHARACTERIZATION OF SEMICONDUCTORS BY EBIC AND CL

D.B. HOLT

J. Phys. Colloques, 50 C6 (1989) C6-3-C6-14

DOI: https://doi.org/10.1051/jphyscol:1989601

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This article has been cited by the following article(s):

Understanding and optimizing EBIC pn-junction characterization from modeling insights

Ruinan Zhou, Mingzhe Yu, David Tweddle, Phillip Hamer, Daniel Chen, Brett Hallam, Alison Ciesla, Pietro P. Altermatt, Peter R. Wilshaw and Ruy S. Bonilla
Journal of Applied Physics 127 (2) (2020)
https://doi.org/10.1063/1.5139894