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THE FIM100 - PERFORMANCE OF A COMMERCIAL ATOM PROBE SYSTEM

A. Cerezo, G.D.W. Smith, A.R. Waugh

J. Phys. Colloques, 45 C9 (1984) C9-329-C9-335

DOI: https://doi.org/10.1051/jphyscol:1984955

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Citations de cet article :

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

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Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments

Tomas L. Martin, Andrew J. London, Benjamin Jenkins, et al.
Microscopy and Microanalysis 23 (2) 227 (2017)
https://doi.org/10.1017/S1431927617000356

Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography

Frederick Meisenkothen, Eric B. Steel, Ty J. Prosa, Karen T. Henry and R. Prakash Kolli
Ultramicroscopy 159 101 (2015)
https://doi.org/10.1016/j.ultramic.2015.07.009

Correction of dead time effects in laser-induced desorption time-of-flight mass spectrometry: Applications in atom probe tomography

Thomas Stephan, Philipp R. Heck, Dieter Isheim and Josiah B. Lewis
International Journal of Mass Spectrometry 379 46 (2015)
https://doi.org/10.1016/j.ijms.2014.12.006

The role of atom-probe techniques in the investigation of some selected metallurgical problems

D. Blavette
Surface Science 266 (1-3) 299 (1992)
https://doi.org/10.1016/0039-6028(92)91037-C