ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE R. BELLENS, P. HEREMANS, G. GROESENEKEN and H.E. MAES J. Phys. Colloques, 49 C4 (1988) C4-651-C4-655 DOI: 10.1051/jphyscol:19884136