Supplément au Journal de Physique Colloques

LIGHT BEAM INDUCED CURRENT IMAGING OF THE ELECTRICAL ACTIVITY OF STACKING FAULTS IN CZ SILICON

A. CASTALDINI, A. CAVALLINI, A. POGGI and E. SUSI

J. Phys. Colloques, 50 C6 (1989) C6-169

DOI: 10.1051/jphyscol:1989626

A. CASTALDINI

A. CAVALLINI

A. POGGI

E. SUSI

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