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PROGRESS IN FIELD ION MICROSCOPY IMAGING OF HIGH-T_c SUPERCONDUCTING OXIDES

A.J. MELMED, R.D. SHULL and C.K. CHIANG

J. Phys. Colloques, 49 C6 (1988) C6-459-C6-464

DOI: 10.1051/jphyscol:1988678

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