Supplément au Journal de Physique Colloques

ANNEALING OF HOT-CARRIER-INDUCED MOSFET DEGRADATION

R. MAHNKOPF, G. PRZYREMBEL and H.G. WAGEMANN

J. Phys. Colloques, 49 C4 (1988) C4-771-C4-774

DOI: 10.1051/jphyscol:19884161

R. MAHNKOPF

G. PRZYREMBEL

H.G. WAGEMANN

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