THIN FILM COMPOSITIONAL ANALYSIS BY LOW-ENERGY ELECTRON-INDUCED X-RAY SPECTROMETRY (LEEIXS). NEW APPLICATIONS M. ROMAND, M. CHARBONNIER and F. GAILLARD J. Phys. Colloques, 48 C9 (1987) C9-87-C9-90 DOI: 10.1051/jphyscol:1987912