Supplément au Journal de Physique Colloques

DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE

F.R. THORNLEY, G.M. ANTONINI, G.N. GREAVES and N.T. BARRETT

J. Phys. Colloques, 47 C8 (1986) C8-883-C8-886

DOI: 10.1051/jphyscol:19868171

F.R. THORNLEY

G.M. ANTONINI

G.N. GREAVES

N.T. BARRETT

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