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GROWTH OF THIN SINGLE CRYSTAL NiSi₂ FILMS OF Si SURFACES, A FIELD ION MICROSCOPE STUDY

H.F. LIU, H.M. LIU and T.T. TSONG

J. Phys. Colloques, 47 C2 (1986) C2-315-C2-319

DOI: 10.1051/jphyscol:1986248

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