Supplément au Journal de Physique Colloques

Subscriber Authentication Point

EDPS Account

GROWTH CHARACTERIZATION OF a Si:H FILMS BY MULTIPLE ANGLE OF INCIDENCE SPECTROSCOPIC ELLIPSOMETRY

J. Perrin and B. Drevillon

J. Phys. Colloques, 44 C10 (1983) C10-247-C10-251

DOI: 10.1051/jphyscol:19831052

This search tool will display articles in our database by authors of the selected article:

Select your author(s):

J. Perrin

B. Drevillon

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)