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DIFFRACTION STUDY OF THE a-Si:H STRUCTURE EVOLUTION DURING ANNEALING TREATMENTS PERFORMED DIRECTLY ON THE X RAY GONIOMETER

J. Dixmier, R. Mosseri and J.F. Sadoc

J. Phys. Colloques, 42 C4 (1981) C4-237-C4-240

DOI: 10.1051/jphyscol:1981450

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