ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE R. BELLENS, P. HEREMANS, G. GROESENEKEN and H. E. MAESJ. Phys. Colloques, 49 C4 (1988) C4-651-C4-655DOI: https://doi.org/10.1051/jphyscol:19884136
