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Cited article:

INTERFACIAL DEFECTS IN GaAs/Si AFTER ANNEALING

A. ROCHER, M.-N. CHARASSE, B. BARTENLIAN, J. CHAZELAS

J. Phys. Colloques, 51 C1 (1990) C1-915-C1-920

DOI: https://doi.org/10.1051/jphyscol:19901144

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