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Cited article:

Correlated structural and magnetization reversal studies on epitaxial Ni films grown with molecular beam epitaxy and with sputtering

Zhengdong Zhang, R. A. Lukaszew, C. Cionca, et al.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 22 (4) 1868 (2004)
https://doi.org/10.1116/1.1692292

Misfit dislocation network at the Ag/MgO(001) interface: A grazing-incidence x-ray-scattering study

G. Renaud, P. Guénard and A. Barbier
Physical Review B 58 (11) 7310 (1998)
https://doi.org/10.1103/PhysRevB.58.7310

Growth, annealing and oxidation of the Ni/MgO (001) interface studied by grazing incidence x-ray scattering

A. Barbier, G. Renaud and O. Robach
Journal of Applied Physics 84 (8) 4259 (1998)
https://doi.org/10.1063/1.368643