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Cited article:

Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB

Yi Qiao, Yalong Zhao, Zheng Zhang, Binbin Liu, Fusheng Li, Huan Tong, Jintong Wu, Zhanqi Zhou, Zongwei Xu and Yue Zhang
Micromachines 13 (1) 35 (2021)
https://doi.org/10.3390/mi13010035

Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

Ty J. Prosa and David J. Larson
Microscopy and Microanalysis 23 (2) 194 (2017)
https://doi.org/10.1017/S1431927616012642

Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features

Matthew I. Hartshorne, Dieter Isheim, David N. Seidman and Mitra L. Taheri
Ultramicroscopy 147 25 (2014)
https://doi.org/10.1016/j.ultramic.2014.05.005