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Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography
Baptiste Gault, Aparna Saksena, Xavier Sauvage, Paul Bagot, Leonardo S Aota, Jonas Arlt, Lisa T Belkacemi, Torben Boll, Yi-Sheng Chen, Luke Daly, Milos B Djukic, James O Douglas, Maria J Duarte, Peter J Felfer, Richard G Forbes, Jing Fu, Hazel M Gardner, Ryota Gemma, Stephan S A Gerstl, Yilun Gong, Guillaume Hachet, Severin Jakob, Benjamin M Jenkins, Megan E Jones, Heena Khanchandani, et al. Microscopy and Microanalysis 30(6) 1205 (2025) https://doi.org/10.1093/mam/ozae081
Isotopic Correction of Compositional Inaccuracies in the Atom Probe Analysis of LaB6
S. Ndiaye, O. Bhorade, I. Blum, B. Klaes, C. Bacchi, J. Houard, A. Vella, F. Vurpillot and L. Rigutti The Journal of Physical Chemistry C 128(7) 2937 (2024) https://doi.org/10.1021/acs.jpcc.3c07595
Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting
Samba Ndiaye, Sébastien Duguay, François Vurpillot, Chiara Carraro, Gianluigi Maggioni, Enrico Di Russo, Davide De Salvador, Enrico Napolitani and Lorenzo Rigutti Materials Science in Semiconductor Processing 164 107641 (2023) https://doi.org/10.1016/j.mssp.2023.107641
Quantification of dopant species using atom probe tomography for semiconductor application
Wai Kong Yeoh, Shih‐Wei Hung, Shih‐Che Chen, Yi‐Hsiang Lin and Jang Jung Lee Surface and Interface Analysis 52(5) 318 (2020) https://doi.org/10.1002/sia.6706
Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach
Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments