Articles citing this article

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Cited article:

The study of the oxidation of thin Ti films by neutron reflectometry

V A Matveev, N K Pleshanov, A P Bulkin and V G Syromyatnikov
Journal of Physics: Conference Series 340 012086 (2012)
https://doi.org/10.1088/1742-6596/340/1/012086

Experimental verification of the applicability of a new method for improving polarizing neutron coatings

N. K. Pleshanov, A. P. Bulkin and V. G. Syromyatnikov
Physics of the Solid State 52 (5) 1018 (2010)
https://doi.org/10.1134/S1063783410050288

Observation of difference in nuclear and magnetic roughness in CoFe/TiZr multilayers by polarized neutron reflectometry

N.K. Pleshanov, B.G. Peskov, A.F. Schebetov, et al.
Physica B: Condensed Matter 397 (1-2) 62 (2007)
https://doi.org/10.1016/j.physb.2007.02.045

Interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers

P. Donovan, B. George, A. Bruson, et al.
Journal of Applied Physics 69 (3) 1371 (1991)
https://doi.org/10.1063/1.347275