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Cited article:

AES, XPS AND TEM CHARACTERIZATION OF BORON NITRIDE DEPOSITED UNDER CHEMICAL VAPOR INFILTRATION (CVI) CONDITIONS

O. DUGNE, S. PROUHET, A. GUETTE, R. NASLAIN, R. FOURMEAUX, K. HSSEIN, J. SEVELY, C. GUIMON, D. GONBEAU, G. PFISTER-GUILLOUZO

J. Phys. Colloques, 50 C5 (1989) C5-333-C5-341

DOI: https://doi.org/10.1051/jphyscol:1989540

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